Fabrication Equipment
Metal-Organic Chemical Vapor Deposition
( III-nitrides: GaN, AlN, InN, and their alloys )
Plasma-Assisted Molecular Beam Epitaxy
( Sc, Ga, In, Al, N, Mg, Si )
Magnetron 3-target CO-Sputtering System
Using Au, Ag, Pt targets
Characterization Equipment
Mapping System for FWHM, Intensity, and TRPL in the 200–1500 nm Wavelength Range
200-1200 nm wavelength
230-920 nm wavelength
215-300 nm wavelength TCSPC
300-1000 nm wavelength TCSPC
Lumerical FDTD , Mode, COMSOL Multiphysics
I-V, L-I, L-I-L, EL measurements
CIE 색좌표, Goniometer(각도별 측정)
Nano-scale wavength mapping
300-1000 nm wavelength
215-500 nm wavelength
micro-PL / EL Mapping, TRPL
Keithley 2400 Sourcemeter
Photovoltaic Powermeter
300 W Xenon Lamp
1 kW Solar Simulator
Long-Term Reliability Testing
WizEIS - 1200 Premium
VersaSTAT 3
Analyzes H₂, O₂, and CO₂
Storage Equipment